BS EN 60749-24:2004
$86.31
Semiconductor devices. Mechanical and climatic test methods – Accelerated moisture resistance. Unbiased HAST
| Published By | Publication Date | Number of Pages |
| BSI | 2004 | 10 |
The unbiased highly accelerated stress test is performed for the purpose of evaluating the reliability of non-hermetically packaged solid-state devices in humid environments. It employs temperature and humidity under non-condensing conditions to accelerate the penetration of moisture through the external protective material or along the interface between the external protective material and the metallic conductors which pass through it.
