BS EN 61207-7:2013:2015 Edition
$142.49
Expression of performance of gas analyzers – Tuneable semiconductor laser gas analyzers
| Published By | Publication Date | Number of Pages |
| BSI | 2015 | 28 |
This part of IEC 61207 applies to all aspects of analyzers utilizing TSLAS for the concentration measurement of one or more gas components in a gaseous mixture or vapour.
It applies to analyzers utilizing tuneable semiconductor lasers as sources and utilizing absorption spectroscopy, such as direct absorption, FMS, WMS, multi-pass absorption spectroscopy, CRDS, ICOS, PAS and CEAS techniques, etc.
It applies both to in situ or extractive type analyzers. This standard includes the following, it
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specifies the terms and definitions related to the functional performance of gas analyzers, utilizing tuneable semiconductor laser gas absorption spectroscopy, for the continuous measurement of gas or vapour concentration in a source gas,
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unifies methods used in making and verifying statements on the functional performance of this type of analyzers,
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specifies the type of tests to be performed to determine the functional performance and how to carry out these tests,
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provides basic documents to support the application of the standards of quality assurance with in ISO 9001
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 6 | English CONTENTS |
| 7 | INTRODUCTION |
| 8 | 1 Scope 2 Normative references |
| 9 | 3 Terms and definitions |
| 12 | 4 Procedure for specification 4.1 General 4.2 In situ analyzers 4.2.1 Additional operation and maintenance requirements 4.2.2 Additional terms related to the specification of performance |
| 13 | 4.2.3 Additional limits of uncertainties 4.3 Extractive analyzers 4.3.1 Additional operation and maintenance requirements |
| 14 | 4.3.2 Additional terms related to the specification of performance 4.4 Recommended standard values and range of influence quantities 4.5 Laser safety 5 Procedures for compliance testing 5.1 In situ analyzers 5.1.1 General |
| 15 | 5.1.2 Apparatus to simulate measurement condition 5.1.3 Apparatus to generate test gas mixture 5.1.4 Apparatus to investigate the attenuation induced by opaque dust, liquid droplets and other particles |
| 16 | 5.1.5 Testing procedures |
| 18 | 5.2 Extractive analyzers 5.2.1 General 5.2.2 Apparatus to generate test gas mixture 5.2.3 Testing procedures |
| 20 | Annex A (informative) Systems of tuneable semiconductor laser gas analyzers Figures Figure A.1 – Tuneable semiconductor laser gas analyzers |
| 21 | Annex B (normative) Examples of the test apparatus Figure B.1 – Example of a test apparatus to simulate measurement condition for across-duct and open-path analyzers Figure B.2 – Example of a test apparatus to simulate measurement condition for probe type analyzers |
| 22 | Figure B.3 – Example of apparatus to generate the test gas mixture |
| 23 | Figure B.4 – Delay time, rise time and fall time |
| 24 | Figure B.5 – Example of a grid to simulate the attenuation by the dust in optical path |
| 25 | Bibliography |
