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BS EN 62132-2:2011

BS EN 62132-2:2011

$142.49

Integrated circuits. Measurement of electromagnetic immunity – Measurement of radiated immunity. TEM cell and wideband TEM cell method

Published By Publication Date Number of Pages
BSI 2011 28
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This International Standard specifies a method for measuring the immunity of an integrated circuit (IC) to radio frequency (RF) radiated electromagnetic disturbances. The frequency range of this method is from 150 kHz to 1 GHz, or as limited by the characteristics of the TEM cell.

PDF Catalog

PDF Pages PDF Title
6 English
CONTENTS
7 1 Scope
2 Normative references
3 Terms and definitions
8 4 General
9 5 Test conditions
6 Test equipment
6.1 General
6.2 Cables
6.3 RF disturbance source
10 6.4 TEM cell
6.5 Gigahertz TEM cell
6.6 50 Ω termination
6.7 DUT monitor
7 Test set-up
7.1 General
7.2 Test set-up details
11 Figures
Figure 1 – TEM and GTEM cell cross-section
Figure 2 – TEM cell test set-up
12 7.3 EMC test board
8 Test procedure
8.1 General
8.2 Immunity measurement
Figure 3 – GTEM cell test set-up
14 9 Test report
Figure 4 – Immunity measurement procedure flowchart
15 Annex A (normative) Field strength characterization procedure
16 Figure A.1 – E field characterization test fixture
18 Figure A.2 – The electric field to voltage transfer function
21 Figure A.3 – H field characterization test fixture
22 Figure A.4 – The magnetic field to voltage transfer function
23 Annex B (informative) TEM CELL and wideband TEM cell descriptions
24 Bibliography

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BS EN 62132-2:2011
$142.49