BS IEC 60115-4-10:2023:2024 Edition
$189.07
Fixed resistors for use in electronic equipment – Blank detail specification: Power resistors with axial leads for through-hole assembly on circuit boards (THT), for general electronic equipment, classification level G
Published By | Publication Date | Number of Pages |
BSI | 2024 | 50 |
PDF Catalog
PDF Pages | PDF Title |
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2 | undefined |
4 | CONTENTS |
7 | FOREWORD |
9 | 0 Introduction to the template provided by this blank detail specification 0.1 Scope of this blank detail specification 0.2 Function of this blank detail specification |
10 | 0.3 Identification of the detail specification and the resistor |
12 | 1 Scope 2 Normative references |
13 | 3 Terms and definitions 4 Characteristics and ratings 4.1 General 4.2 Dimensions |
14 | Figures Figure 1 – Outline and dimensions Tables Table 1 – Styles and dimensions |
15 | 4.3 Ratings Figure 2 – Lead eccentricity of the wire terminations Figure 3 – Length of excessive coating on the wire terminations |
16 | Table 2 – Climatic categories Table 3 – Ratings |
17 | 4.4 Resistance range and tolerance on resistance Figure 4 – Derating curve for power resistors |
18 | 5 Tests and test severities 5.1 General 5.2 Resistance Table 4 – Temperature coefficients, tolerances and resistance rangesfor climatic category … / … / … |
19 | 5.3 Temperature coefficient of resistance 5.4 Temperature rise 5.5 Endurance at the rated temperature 70 °C 5.6 Endurance at other than rated temperature 5.6.1 Endurance at room temperature 5.6.2 Endurance at a maximum temperature: UCT with category dissipation 5.7 Short-term overload of power resistors 5.7.1 Power film resistors |
20 | 5.7.2 Wirewound resistors 5.8 Electrostatic discharge (ESD) test 5.9 Visual examination Table 5 – Short-term overload duration Table 6 – ESD test voltages |
21 | 5.10 Gauging of dimensions 5.11 Detail dimensions 5.12 Robustness 5.12.1 Robustness of terminations 5.12.2 Robustness of the resistor body 5.13 Shock and vibration 5.13.1 Vibration 5.13.2 Shock or bump 5.14 Rapid change of temperature |
22 | 5.15 Climatic sequence 5.16 Damp heat, steady state test Table 7 – Additional cycles of the damp heat, cyclic test Table 8 – Damp heat, steady state test duration |
23 | 5.17 Solderability, with lead-free solder 5.18 Solderability, with SnPb solder 5.19 Resistance to soldering heat 5.20 Solvent resistance test |
24 | 5.21 Insulation resistance 5.22 Voltage proof 5.23 Flammability test 6 Performance requirements 6.1 General 6.2 Limits for change of resistance at tests |
25 | 6.3 Temperature coefficient of resistance Table 9 – Limits for change of resistance at tests |
26 | 6.4 Temperature rise 6.5 Visual examination 6.5.1 General visual criteria Table 10 – Permitted change of resistance due to the variation of temperature |
27 | 6.5.2 Visual criteria after tests 6.5.3 Visual criteria for packaging 6.6 Solderability 6.7 Insulation resistance |
28 | 6.8 Flammability 7 Marking, packaging and ordering information 7.1 Marking of the component 7.2 Packaging 7.3 Marking of the packaging 7.4 Ordering information |
29 | 8 Additional information 8.1 General 8.2 Storage and Transportation 8.3 Substrate for assembly 8.4 Soldering process 8.5 Use of cleaning agents or solvents |
30 | 8.6 Coating or potting after assembly 9 Quality assessment procedures 9.1 General 9.1.1 100 % test 9.1.2 Certificate of Conformity (CoC) |
31 | 9.1.3 Certified test records of released lots 9.2 Qualification approval 9.3 Maintenance of a qualification approval 9.3.1 Quality conformance inspection 9.3.2 Non-conforming specimen |
32 | Table 11 – Test schedule for the qualification approval of power resistors(1 of 5) |
37 | Table 12 – Test schedule for quality conformance inspection of power resistors(1 of 5) |
43 | Annex A (normative)Symbols and abbreviated terms A.1 Symbols |
45 | A.2 Abbreviated terms |
46 | Annex B (normative)Reference for visual examination |
47 | Annex X (informative)Cross-reference for references to the prior revision of this specification Table X.1 – Cross reference for references to clauses |
48 | Bibliography |