BS IEC 62396-2:2017 – TC:2020 Edition
$246.62
Tracked Changes. Process management for avionics. Atmospheric radiation effects – Guidelines for single event effects testing for avionics systems
| Published By | Publication Date | Number of Pages |
| BSI | 2020 | 99 |
IEC 62396-2:2017(E) aims to provide guidance related to the testing of electronic components for purposes of measuring their susceptibility to single event effects (SEE) induced by neutrons generated by cosmic ray interactions in the Earth’s atmosphere (atmospheric neutrons). Since the testing can be performed in a number of different ways, using different kinds of radiation sources, it also shows how the test data can be used to estimate the SEE rate of electronic components and boards due to atmospheric neutrons at aircraft altitudes. Although developed for the avionics industry, this process can be applied by other industrial sectors.
PDF Catalog
| PDF Pages | PDF Title |
|---|---|
| 55 | undefined |
| 57 | CONTENTS |
| 59 | FOREWORD |
| 61 | INTRODUCTION |
| 62 | 1 Scope 2 Normative references 3 Terms and definitions 4 Abbreviated terms |
| 64 | 5 Obtaining SEE data 5.1 Types of SEE data 5.2 Use of existing SEE data 5.2.1 General |
| 65 | 5.2.2 Heavy ion data 5.2.3 High energy neutron and proton data |
| 66 | 5.2.4 Thermal neutron data 5.3 Deciding to perform dedicated SEE tests 6 Availability of existing SEE data for avionics applications 6.1 Variability of SEE data 6.2 Types of existing SEE data that may be used 6.2.1 General |
| 68 | 6.2.2 Sources of data, proprietary versus published data |
| 69 | 6.2.3 Data based on the use of different sources |
| 70 | Figures Figure 1 – Comparison of Los Alamos, TRIUMF and ANITA neutron spectrawith terrestrial/avionics neutron spectra (JESD89A and IEC 62396-1) |
| 72 | Figure 2 – Variation of high energy neutron SEU cross-section per bitas a function of electronic component feature size for SRAM andSRAM arrays in FPGA and microprocessors |
| 73 | Figure 3 – Percentage fraction of SEU rate from atmospheric neutronscontributed by neutrons with E 10 MeV |
| 74 | 6.2.4 Ground level versus avionics applications 6.3 Sources of existing data |
| 75 | Tables Table 1 – Sources of existing data (published after 2000) |
| 77 | 7 Considerations for SEE testing 7.1 General 7.2 Selection of hardware to be tested 7.3 Selection of test method |
| 78 | 7.4 Selection of facility providing energetic particles 7.4.1 Radiation sources |
| 79 | 7.4.2 Spallation neutron sources |
| 80 | 7.4.3 Monoenergetic and quasi-monoenergetic beam sources |
| 81 | 7.4.4 Thermal neutron sources |
| 82 | 7.4.5 Whole system and equipment testing |
| 83 | 8 Converting test results to avionics SEE rates 8.1 General 8.2 Use of spallation neutron source |
| 84 | 8.3 Use of SEU cross-section curve over energy |
| 86 | Figure 4 – Comparison of monoenergetic SEU cross-sectionswith Weibull and piece-wise linear fits |
| 87 | 8.4 Measured SEU rates for different accelerator-based neutron sources 8.5 Influence of upper neutron energy on the accuracy of calculated SEE rates – Verification and compensation Table 2 – Spectral distribution of neutron energies |
| 89 | Annex A (informative)Sources of SEE data published before the year 2000 Table A.1 – Sources of existing SEE data published before the year 2000 |
| 90 | Bibliography |
