IEEE C62.59-2019

$37.92

IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes

Published By	Publication Date	Number of Pages
IEEE	2019

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Description

New IEEE Standard – Active. Supersedes IEEE C62.35-2010 and IEEE C62.35-2010/Cor1-2018. The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard. It is intended that this standard be used for the harmonization of existing or future specifications issued by PN diode surge protective component manufacturers, telecommunication equipment manufacturers, administrations, or network operators.

PDF Catalog

PDF Pages	PDF Title
1	IEEE Std C62.59-2019 Front cover
2	Title page
4	Important Notices and Disclaimers Concerning IEEE Standards Documents
7	Participants
8	Introduction
9	Contents
10	1. Overview 1.1 Scope 1.2 Word usage
11	2. Normative references 3. Definitions, acronyms, and abbreviation 3.1 Definitions
15	3.2 Acronyms and abbreviations
16	4. Conventions 4.1 Letter symbols
17	4.2 Component graphical symbols
19	4.3 IEEE Std C62.42.3-2017 5. Environments 5.1 General 5.2 Normal service conditions 5.3 Storage temperature range, Tstgmin to Tstgmax
20	5.4 Lead soldering temperature, Tlmax 6. Essential characteristics and ratings 6.1 General 6.2 Electrical characteristics
23	6.3 Thermal ratings 6.4 Electrical ratings 7. Measuring and test methods 7.1 Mounting and ambient conditions
24	7.2 Test circuits
25	7.3 Measuring methods for electrical characteristics
29	7.4 Measuring methods for thermal characteristics
30	7.5 Verification test methods for ratings (limiting values)
31	8. Identification 8.1 Marking 8.2 Documentation
33	Annex A (informative) Bibliography
35	Annex B (normative) Preferred values and parameter variation B.1 Introduction B.2 Limiting voltage threshold
36	B.3 Clamping voltage
37	B.4 Surge current capability B.5 Capacitance
38	Annex C (informative) Component qualification C.1 Introduction C.2 Test samples C.3 Electrical parameter distribution C.4 Reliability testing
41	Back cover