{"id":302567,"date":"2024-10-19T20:40:21","date_gmt":"2024-10-19T20:40:21","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iec-ts-62607-6-42016\/"},"modified":"2024-10-25T18:12:03","modified_gmt":"2024-10-25T18:12:03","slug":"bsi-pd-iec-ts-62607-6-42016","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iec-ts-62607-6-42016\/","title":{"rendered":"BSI PD IEC\/TS 62607-6-4:2016"},"content":{"rendered":"
This part of IEC 62607 establishes a method for determining the surface conductance of two-dimensional (2D) single-layer or multi-layer atomically thin nano-carbon graphene structures. These are synthesized by chemical vapour deposition (CVD), epitaxial growth on silicon carbide (SiC), obtained from reduced graphene oxide (rGO) or mechanically exfoliated from graphite [3]. The measurements are made in an air filled standard R100 rectangular waveguide configuration, at one of the resonant frequency modes, typically at 7 GHz [4].<\/p>\n
Surface conductance measurement by resonant cavity involves monitoring the resonant frequency shift and change in the quality factor before and after insertion of the specimen into the cavity in a quantitative correlation with the specimen surface area. This measurement does not explicitly depend on the thickness of the nano-carbon layer. The thickness of the specimen does not need to be known, but it is assumed that the lateral dimension is uniform over the specimen area.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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4<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | INTRODUCTION <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions 3.1 Graphene layers <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 3.2 Measurement terminology <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4 Microwave cavity test fixture <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 5 Test specimen 6 Measurement procedure 6.1 Apparatus Figures Figure 1 \u2013 Microwave cavity test fixture <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 6.2 Calibration 6.3 Measurements 6.3.1 General 6.3.2 Empty cavity 6.3.3 Specimen <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 6.3.4 Repeated procedure 6.3.5 Substrate 7 Calculations of surface conductance 8 Report <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 9 Accuracy consideration <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | Annex A (informative) Case study of surface conductance measurement of single-layer and few-layer graphene A.1 General A.2 Cavity perturbation procedure <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | A.3 Experimental procedure A.4 Results <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | A.5 Surface conductance of single-layer graphene and few-layer graphene Figure A.1 \u2013 S21 magnitude of the resonant peak TE103 as a function of frequency at several specimen insertions (hx) Figure A.2 \u2013 Plots of 1\/Qx \u2212 1\/Q0 as a function of the normalized specimen area (w\u200ahx). <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | A.6 Summary <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Nanomanufacturing. Key control characteristics – Graphene. Surface conductance measurement using resonant cavity<\/b><\/p>\n |