{"id":374698,"date":"2024-10-20T02:39:54","date_gmt":"2024-10-20T02:39:54","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-iso-ts-222922021\/"},"modified":"2024-10-26T04:38:45","modified_gmt":"2024-10-26T04:38:45","slug":"bsi-pd-iso-ts-222922021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-iso-ts-222922021\/","title":{"rendered":"BSI PD ISO\/TS 22292:2021"},"content":{"rendered":"
This document provides guidance for sample preparation, data acquisition by transmission electron microscopy, data processing, and three-dimensional image reconstruction to measure size and shape parameters of nano-objects on rod-shaped supports. The method is applicable to samples dispersed on or within an electron-transparent rod-shaped support.<\/p>\n
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | National foreword <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | Foreword <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | Introduction <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 3.1 Nanotechnology-related terms 3.2 Instrument-related terms <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 3.3 Measurement-related terms <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 4 Sample considerations 4.1 General 4.2 Choice of sample rod diameter 5 Instrument factors 5.1 Microscope set up 5.1.1 General <\/td>\n<\/tr>\n | ||||||
15<\/td>\n | 5.1.2 Acceleration voltage 5.1.3 Convergence semi-angle 5.1.4 Collection angle 5.1.5 Microscope magnification 5.1.6 Number of pixels of the detector <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | 5.1.7 Image acquisition time 5.2 Microscope calibration <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | 6 Image capture (data acquisition) 6.1 General 6.2 Procedure <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | 7 Data alignment and volume reconstruction 7.1 General 7.2 Procedure 8 Reconstructed volume evaluation and data analysis 8.1 General 8.2 Identification of nanoparticles and 3D volume <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | 8.3 Thresholding for measurand extraction <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | 9 Expression of results 9.1 Extracting parameters for each well-separated nano-object <\/td>\n<\/tr>\n | ||||||
24<\/td>\n | 9.2 Measurement uncertainty 9.3 Sources of errors 9.3.1 Error arising from sample that is not representative of the object of interest 9.3.2 Acquisition of 2D projected images <\/td>\n<\/tr>\n | ||||||
26<\/td>\n | 9.3.3 Instrument calibration 9.3.4 Alignment of the projected images 9.3.5 Reconstruction of the 3D volume 9.3.6 Discrete representation of the objects (nanoparticles) in 3D <\/td>\n<\/tr>\n | ||||||
27<\/td>\n | 9.3.7 Interpretation of the obtained measurands 9.3.8 Limited number of observed objects (nanoparticles) <\/td>\n<\/tr>\n | ||||||
28<\/td>\n | 10 Test report <\/td>\n<\/tr>\n | ||||||
30<\/td>\n | Annex A (informative) Sample preparation <\/td>\n<\/tr>\n | ||||||
37<\/td>\n | Annex B (informative) STEM set up <\/td>\n<\/tr>\n | ||||||
39<\/td>\n | Annex C (normative) Tomography reconstruction and visualization software packages <\/td>\n<\/tr>\n | ||||||
41<\/td>\n | Annex D (informative) Microscope data collection parameters <\/td>\n<\/tr>\n | ||||||
42<\/td>\n | Annex E (informative) Case study: Metal nanoparticle, ILC results <\/td>\n<\/tr>\n | ||||||
47<\/td>\n | Annex F (informative) Case study \u2014 Organic nanoparticles \u2014 Sample preparation and use <\/td>\n<\/tr>\n | ||||||
48<\/td>\n | Annex G (informative) Particle distortions arising from FBP and SIRT reconstruction methods <\/td>\n<\/tr>\n | ||||||
50<\/td>\n | Annex H (informative) Uncertainty budget <\/td>\n<\/tr>\n | ||||||
52<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Nanotechnologies. 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy<\/b><\/p>\n |