{"id":386078,"date":"2024-10-20T03:33:45","date_gmt":"2024-10-20T03:33:45","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bsi-pd-cen-clc-tr-17603-10-122021\/"},"modified":"2024-10-26T06:29:36","modified_gmt":"2024-10-26T06:29:36","slug":"bsi-pd-cen-clc-tr-17603-10-122021","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bsi-pd-cen-clc-tr-17603-10-122021\/","title":{"rendered":"BSI PD CEN\/CLC\/TR 17603-10-12:2021"},"content":{"rendered":"

This handbook is a part of the System Engineering branch and covers the methods for the calculation of radiation received and its effects, and a policy for design margins. Both natural and man-made sources of radiation (e.g.<\/i> radioisotope thermoelectric generators, or RTGs) are considered in the handbook.<\/p>\n

This handbook can be applied to the evaluation of radiation effects on all space systems.<\/p>\n

This handbook can be applied to all product types which exist or operate in space, as well as to crews of on manned space missions.<\/p>\n

This handbook complements to EN 16603-10-12 \u201cMethods for the calculation of radiation received and its effects and a policy for the design margin\u201d.<\/p>\n

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
12<\/td>\n1 Scope <\/td>\n<\/tr>\n
13<\/td>\n2 Terms, definitions and abbreviated terms
2.1 Terms from other documents
2.2 Terms specific to the present handbook
2.3 Abbreviated terms <\/td>\n<\/tr>\n
14<\/td>\n3 Compendium of radiation effects
3.1 Purpose <\/td>\n<\/tr>\n
16<\/td>\n3.2 Effects on electronic and electrical systems
3.2.1 Total ionising dose
3.2.2 Displacement damage <\/td>\n<\/tr>\n
17<\/td>\n3.2.3 Single event effects <\/td>\n<\/tr>\n
18<\/td>\n3.3 Effects on materials
3.4 Payload-specific radiation effects <\/td>\n<\/tr>\n
19<\/td>\n3.5 Biological effects
3.6 Spacecraft charging
3.7 References <\/td>\n<\/tr>\n
21<\/td>\n4 Margin
4.1 Introduction
4.1.1 Application of margins <\/td>\n<\/tr>\n
22<\/td>\n4.2 Environment uncertainty <\/td>\n<\/tr>\n
23<\/td>\n4.3 Effects parameters\u2019 uncertainty
4.3.1 Overview
4.3.2 Shielding <\/td>\n<\/tr>\n
24<\/td>\n4.3.3 Ionising dose calculation
4.3.4 Non-ionising dose (NIEL, displacement damage)
4.3.5 Single event effects <\/td>\n<\/tr>\n
25<\/td>\n4.3.6 Effects on sensors
4.4 Testing-related uncertainties
4.4.1 Overview
4.4.2 Beam characteristics
4.4.3 Radioactive sources <\/td>\n<\/tr>\n
26<\/td>\n4.4.4 Packaging
4.4.5 Penetration
4.4.6 Representativeness
4.5 Procurement processes and device reproducibility <\/td>\n<\/tr>\n
27<\/td>\n4.6 Project management decisions
4.7 Relationship with derating
4.8 Typical design margins
4.9 References <\/td>\n<\/tr>\n
28<\/td>\n5 Radiation shielding
5.1 Introduction
5.2 Radiation transport processes
5.2.1 Overview
5.2.2 Electrons <\/td>\n<\/tr>\n
30<\/td>\n5.2.3 Protons and other heavy particles <\/td>\n<\/tr>\n
34<\/td>\n5.2.4 Electromagnetic radiation \u2013 bremsstrahlung <\/td>\n<\/tr>\n
35<\/td>\n5.3 Ionising dose enhancement
5.4 Material selection
5.5 Equipment design practice
5.5.1 Overview <\/td>\n<\/tr>\n
36<\/td>\n5.5.2 The importance of layout
5.5.3 Add-on shielding
5.5.3.1 Introduction <\/td>\n<\/tr>\n
37<\/td>\n5.5.3.2 On-PCB shielding <\/td>\n<\/tr>\n
38<\/td>\n5.5.3.3 Whole box shielding
5.6 Shielding calculation methods and tools \u2013 Decision on using deterministic radiation calculations, detailed Monte Carlo simulations, or sector shielding analysis <\/td>\n<\/tr>\n
47<\/td>\n5.7 Example detailed radiation transport and shielding codes
5.8 Uncertainties <\/td>\n<\/tr>\n
48<\/td>\n5.9 References <\/td>\n<\/tr>\n
50<\/td>\n6 Total ionising dose
6.1 Introduction
6.2 Definition
6.3 Technologies sensitive to total ionising dose <\/td>\n<\/tr>\n
52<\/td>\n6.4 Total ionising dose calculation
6.5 Uncertainties <\/td>\n<\/tr>\n
53<\/td>\n7 Displacement damage
7.1 Introduction
7.2 Definition
7.3 Physical processes and modelling <\/td>\n<\/tr>\n
57<\/td>\n7.4 Technologies susceptible to displacement damage
7.4.1 Overview <\/td>\n<\/tr>\n
58<\/td>\n7.4.2 Bipolar <\/td>\n<\/tr>\n
59<\/td>\n7.4.3 Charge-coupled devices (CCD)
7.4.4 Active pixel sensors (APS) <\/td>\n<\/tr>\n
60<\/td>\n7.4.5 Photodiodes
7.4.6 Laser diodes
7.4.7 Light emitting diode (LED)
7.4.8 Optocouplers <\/td>\n<\/tr>\n
61<\/td>\n7.4.9 Solar cells
7.4.10 Germanium detectors <\/td>\n<\/tr>\n
62<\/td>\n7.4.11 Glasses and optical components
7.5 Radiation damage assessment
7.5.1 Equivalent fluence calculation
7.5.2 Calculation approach
7.5.3 3-D Monte Carlo analysis
7.5.4 Displacement damage testing <\/td>\n<\/tr>\n
63<\/td>\n7.6 NIEL rates for different particles and materials <\/td>\n<\/tr>\n
70<\/td>\n7.7 Uncertainties
7.8 References <\/td>\n<\/tr>\n
72<\/td>\n8 Single event effects
8.1 Introduction <\/td>\n<\/tr>\n
73<\/td>\n8.2 Modelling
8.2.1 Overview
8.2.2 Notion of LET (for heavy ions)
8.2.3 Concept of cross section <\/td>\n<\/tr>\n
74<\/td>\n8.2.4 Concept of sensitive volume, critical charge and effective LET <\/td>\n<\/tr>\n
75<\/td>\n8.3 Technologies susceptible to single event effects
8.4 Test methods
8.4.1 Overview
8.4.2 Heavy ion beam testing <\/td>\n<\/tr>\n
76<\/td>\n8.4.3 Proton and neutron beam testing
8.4.4 Experimental measurement of SEE sensitivity <\/td>\n<\/tr>\n
77<\/td>\n8.4.5 Influence of testing conditions
8.4.5.1 Overview
8.4.5.2 Energy and track structure dependence <\/td>\n<\/tr>\n
78<\/td>\n8.4.5.3 Angle effect on device response
8.4.5.4 Pattern influence <\/td>\n<\/tr>\n
79<\/td>\n8.5 Hardness assurance
8.5.1 Rate prediction
8.5.2 Prediction of SEE rates for ions <\/td>\n<\/tr>\n
81<\/td>\n8.5.3 Improvements <\/td>\n<\/tr>\n
82<\/td>\n8.5.4 Method synthesis
8.5.5 Prediction of SEE rates of protons and neutrons <\/td>\n<\/tr>\n
84<\/td>\n8.5.6 Method synthesis
8.5.7 Calculation toolkit
8.5.8 Applicable derating and mitigating techniques
8.5.9 Analysis at system level <\/td>\n<\/tr>\n
85<\/td>\n8.6 Destructive SEE
8.6.1 Single event latch-up (SEL) and single event snapback (SESB)
8.6.1.1 Definition
8.6.1.2 Sensitive devices
8.6.1.3 Modelling <\/td>\n<\/tr>\n
86<\/td>\n8.6.1.4 Test method
8.6.1.5 Hardness Assurance
8.6.1.6 Prediction issues in case of SEL <\/td>\n<\/tr>\n
87<\/td>\n8.6.2 Single event gate rupture (SEGR) and single event dielectric rupture (SEDR)
8.6.2.1 Definition
8.6.2.2 Sensitive devices
8.6.2.3 Modelling
8.6.2.4 Test method <\/td>\n<\/tr>\n
88<\/td>\n8.6.2.5 Hardness Assurance
8.6.3 Single event burnout (SEB)
8.6.3.1 Definition
8.6.3.2 Sensitive devices
8.6.3.3 Modelling
8.6.3.4 Test method
8.6.3.5 Hardness Assurance <\/td>\n<\/tr>\n
89<\/td>\n8.7 Non-destructive SEE
8.7.1 Single event upset (SEU)
8.7.1.1 Definition
8.7.1.2 Sensitive devices
8.7.1.3 Modelling
8.7.1.4 Test method
8.7.1.5 Hardness assurance
8.7.2 Multiple-cell upset (MCU) and single word multiple-bit upset (SMU)
8.7.2.1 Definitions <\/td>\n<\/tr>\n
90<\/td>\n8.7.2.2 Devices susceptible to MCU
8.7.2.3 Modelling
8.7.2.4 Test <\/td>\n<\/tr>\n
91<\/td>\n8.7.2.5 Hardness assurance
8.7.3 Single event functional interrupt (SEFI)
8.7.3.1 Definition
8.7.3.2 Susceptible components
8.7.3.3 Modelling
8.7.3.4 Test method
8.7.3.5 Hardness assurance <\/td>\n<\/tr>\n
92<\/td>\n8.7.4 Single event hard error (SEHE)
8.7.4.1 Definition
8.7.4.2 Devices susceptible to SEHE
8.7.4.3 Modelling
8.7.4.4 Test method <\/td>\n<\/tr>\n
93<\/td>\n8.7.4.5 Hardness assurance
8.7.5 Single event transient (SET) and single event disturb (SED)
8.7.5.1 Definition
8.7.5.2 Sensitive devices <\/td>\n<\/tr>\n
94<\/td>\n8.7.5.3 Modelling
8.7.5.4 Test method
8.7.5.5 Hardness assurance
8.8 References <\/td>\n<\/tr>\n
98<\/td>\n9 Radiation-induced sensor backgrounds
9.1 Introduction
9.2 Background in ultraviolet, optical and infrared imaging sensors <\/td>\n<\/tr>\n
102<\/td>\n9.3 Background in charged particle detectors
9.4 Background in X-ray CCDs <\/td>\n<\/tr>\n
103<\/td>\n9.5 Radiation background in gamma-ray instruments <\/td>\n<\/tr>\n
106<\/td>\n9.6 Photomultipliers tubes and microchannel plates <\/td>\n<\/tr>\n
107<\/td>\n9.7 Radiation-induced noise in gravity-wave detectors
9.8 Other problems common to detectors <\/td>\n<\/tr>\n
108<\/td>\n9.9 References <\/td>\n<\/tr>\n
110<\/td>\n10 Effects in biological material
10.1 Introduction
10.2 Quantities used in radiation protection work
10.2.1 Overview <\/td>\n<\/tr>\n
111<\/td>\n10.2.2 Protection quantities <\/td>\n<\/tr>\n
113<\/td>\n10.2.3 Operational quantities <\/td>\n<\/tr>\n
115<\/td>\n10.3 Radiation effects in biological systems
10.3.1 Overview <\/td>\n<\/tr>\n
116<\/td>\n10.3.2 Source of data
10.3.3 Early effects <\/td>\n<\/tr>\n
117<\/td>\n10.3.4 Late effects
10.3.4.1 Overview
10.3.4.2 Stochastic late effects <\/td>\n<\/tr>\n
118<\/td>\n10.3.4.3 Deterministic late effects <\/td>\n<\/tr>\n
119<\/td>\n10.4 Radiation protection limits in space
10.4.1 Overview
10.4.2 International agreements <\/td>\n<\/tr>\n
120<\/td>\n10.4.3 Other considerations in calculating crew exposure
10.4.4 Radiation limits used by the space agencies of the partners of the International Space Station (ISS)
10.4.4.1 Proposed CSA Limits <\/td>\n<\/tr>\n
121<\/td>\n10.4.4.2 Proposed ESA Limits
10.4.4.3 Proposed NASA limits <\/td>\n<\/tr>\n
122<\/td>\n10.4.4.4 Proposed JAXA Limits <\/td>\n<\/tr>\n
123<\/td>\n10.4.4.5 Proposed RSA Limits <\/td>\n<\/tr>\n
124<\/td>\n10.5 Uncertainties
10.5.1 Overview
10.5.2 Spacecraft shielding interactions
10.5.3 The unique effects of heavy ions <\/td>\n<\/tr>\n
125<\/td>\n10.5.4 Extrapolation from high-dose effects to low-dose effects
10.5.5 Variability in composition, space and time
10.5.6 Effects of depth-dose distribution
10.5.7 Influence of spaceflight environment <\/td>\n<\/tr>\n
127<\/td>\n10.5.8 Uncertainties summary
10.6 References <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Space engineering. Calculation of radiation and its effects and margin policy handbook<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2021<\/td>\n130<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":386086,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[2641],"product_tag":[],"class_list":{"0":"post-386078","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-bsi","8":"first","9":"instock","10":"sold-individually","11":"shipping-taxable","12":"purchasable","13":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/386078","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/386086"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=386078"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=386078"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=386078"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}