{"id":409720,"date":"2024-10-20T05:36:57","date_gmt":"2024-10-20T05:36:57","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iec-62047-422022\/"},"modified":"2024-10-26T10:18:55","modified_gmt":"2024-10-26T10:18:55","slug":"bs-iec-62047-422022","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iec-62047-422022\/","title":{"rendered":"BS IEC 62047-42:2022"},"content":{"rendered":"
PDF Pages<\/th>\n | PDF Title<\/th>\n<\/tr>\n | ||||||
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2<\/td>\n | undefined <\/td>\n<\/tr>\n | ||||||
3<\/td>\n | CONTENTS <\/td>\n<\/tr>\n | ||||||
5<\/td>\n | FOREWORD <\/td>\n<\/tr>\n | ||||||
7<\/td>\n | 1 Scope 2 Normative references 3 Terms and definitions <\/td>\n<\/tr>\n | ||||||
8<\/td>\n | 4 Test bed of MEMS piezoelectric thin film 4.1 General Figures Figure 1 \u2013 Test bed of piezoelectric MEMS unimorph cantilever <\/td>\n<\/tr>\n | ||||||
9<\/td>\n | Tables Table 1 \u2013 Symbols and designations of test bed <\/td>\n<\/tr>\n | ||||||
10<\/td>\n | 4.2 Functional blocks and components 4.2.1 General Figure 2 \u2013 Setup for measurement of converse piezoelectric effect <\/td>\n<\/tr>\n | ||||||
11<\/td>\n | 4.2.2 Displacement meter 4.2.3 Power source 4.2.4 Electric measurement instrument Figure 3 \u2013 Setup for measurement of direct piezoelectric effect <\/td>\n<\/tr>\n | ||||||
12<\/td>\n | 5 Microcantilever under testing 5.1 General 5.2 Measurement principle <\/td>\n<\/tr>\n | ||||||
13<\/td>\n | 5.3 Measuring procedures of converse transverse piezoelectric coefficient 5.4 Measuring procedures of direct transverse piezoelectric coefficient <\/td>\n<\/tr>\n | ||||||
14<\/td>\n | 6 Test report <\/td>\n<\/tr>\n | ||||||
16<\/td>\n | Annex A (informative) Example of measuring method of piezoelectric MEMS cantilever A.1 General A.2 Measurement procedure A.2.1 Structure of piezoelectric microcantilevers A.2.2 Microfabrication process Figure A.1 \u2013 Structure and photograph of piezoelectric microcantilevers under testing <\/td>\n<\/tr>\n | ||||||
17<\/td>\n | A.2.3 Mechanical properties of piezoelectric and non-piezoelectric layers Figure A.2 \u2013 Fabrication process of piezoelectric microcantilevers Table A.1 \u2013 Mechanical properties of piezoelectric layer <\/td>\n<\/tr>\n | ||||||
18<\/td>\n | A.2.4 Electric properties and resonance frequency of microcantilever Table A.2 \u2013 Mechanical properties of non-piezoelectric layer Table A.3 \u2013 Electric properties of microcantilever Table A.4 \u2013 Resonance frequencies of microcantilever <\/td>\n<\/tr>\n | ||||||
19<\/td>\n | A.2.5 Input displacement of microcantilever for direct piezoelectric coefficient ed31,f Figure A.3 \u2013 Frequency response of tip displacementof each piezoelectric microcantilevers Table A.5 \u2013 Input displacement for direct piezoelectric coefficient ed31,f <\/td>\n<\/tr>\n | ||||||
20<\/td>\n | A.3 Measurement results A.3.1 Converse piezoelectric measurement A.3.2 Direct piezoelectric measurement Figure A.4 \u2013 Tip displacement and converse piezoelectric coefficient as a function of applied voltage Figure A.5 \u2013 Direct piezoelectric coefficient as a function ofinput tip displacement of piezoelectric microcantilevers <\/td>\n<\/tr>\n | ||||||
21<\/td>\n | A.4 Test report Table A.6 \u2013 Test report <\/td>\n<\/tr>\n | ||||||
23<\/td>\n | Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":" Semiconductor devices. Micro-electromechanical devices – Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever<\/b><\/p>\n |