{"id":289814,"date":"2024-10-19T19:39:43","date_gmt":"2024-10-19T19:39:43","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-156322002\/"},"modified":"2024-10-25T16:38:15","modified_gmt":"2024-10-25T16:38:15","slug":"bs-iso-156322002","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-156322002\/","title":{"rendered":"BS ISO 15632:2002"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
3<\/td>\nTitlePage – Microbeam analysis\ufffd\u2014 Instrumental specification for energy dispersive X-ray spectrome… <\/td>\n<\/tr>\n
5<\/td>\nForeword – Foreword <\/td>\n<\/tr>\n
6<\/td>\nIntroduction – Introduction <\/td>\n<\/tr>\n
7<\/td>\nScope – 1\ufffd\ufffd\ufffd Scope <\/td>\n<\/tr>\n
8<\/td>\nClause1 – 3\ufffd\ufffd\ufffd Requirements
Subclause2 – 3.1\ufffd\ufffd\ufffd General description
Subclause2 – 3.2\ufffd\ufffd\ufffd Energy resolution
Subclause2 – 3.3\ufffd\ufffd\ufffd Peak to background ratio
Subclause2 – 3.4\ufffd\ufffd\ufffd Energy dependence of instrumental detection efficiency <\/td>\n<\/tr>\n
9<\/td>\nAnnexNormative – Measurement of line widths (FWHM) to determine the energy resolution of the\ufffdspec…
Clause1 – A.1\ufffd\ufffd\ufffd Specimens
Clause1 – A.2\ufffd\ufffd\ufffd Specimen preparation
Clause1 – A.3\ufffd\ufffd\ufffd Preparatory work
Clause1 – A.4\ufffd\ufffd\ufffd Measurement conditions
Clause1 – A.5\ufffd\ufffd\ufffd Background subtraction <\/td>\n<\/tr>\n
10<\/td>\nClause1 – A.6\ufffd\ufffd\ufffd Calculation of FWHM
Clause1 – A.7\ufffd\ufffd\ufffd Example <\/td>\n<\/tr>\n
12<\/td>\nAnnexNormative – Determination of the L\/K ratio as a measure for the energy dependence of the\ufffdins…
Clause1 – B.1\ufffd\ufffd\ufffd Specimens
Clause1 – B.2\ufffd\ufffd\ufffd Measurement conditions
Clause1 – B.3\ufffd\ufffd\ufffd Calculation of L\/K ratio
Clause1 – B.4\ufffd\ufffd\ufffd Conversion of the L\/K ratio for TOA <\/td>\n<\/tr>\n
14<\/td>\nBibliography – Bibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Microbeam analysis. Instrumental specification for energy dispersive X-ray spectrometers with semiconductor detectors<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2002<\/td>\n16<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":289820,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[1002,2641],"product_tag":[],"class_list":{"0":"post-289814","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-71-040-99","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/289814","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/289820"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=289814"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=289814"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=289814"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}