UNE-EN 60191-6-19:2010

$20.15

Mechanical standardization of semiconductor devices — Part 6-19: Measurement methods of the package warpage at elevated temperature and the maximum permissible warpage

Published By	Publication Date	Number of Pages
AENOR	2010-09-01	17

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Categories: 31.080.01 - Semiconductor devices in general, AENOR

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Additional information

Published Code	AENOR
Published By	Asociación Española de Normalización
Publication Date	2010-09-01
Pages Count	17
Language	English
File Size	593.9 KB
ICS Codes	31.080.01 - Semiconductor devices in general