{"id":462611,"date":"2024-10-20T10:23:12","date_gmt":"2024-10-20T10:23:12","guid":{"rendered":"https:\/\/pdfstandards.shop\/product\/uncategorized\/bs-iso-145942024\/"},"modified":"2024-10-26T19:16:00","modified_gmt":"2024-10-26T19:16:00","slug":"bs-iso-145942024","status":"publish","type":"product","link":"https:\/\/pdfstandards.shop\/product\/publishers\/bsi\/bs-iso-145942024\/","title":{"rendered":"BS ISO 14594:2024"},"content":{"rendered":"

PDF Catalog<\/h4>\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n\n
PDF Pages<\/th>\nPDF Title<\/th>\n<\/tr>\n
2<\/td>\nundefined <\/td>\n<\/tr>\n
6<\/td>\nForeword <\/td>\n<\/tr>\n
7<\/td>\nIntroduction <\/td>\n<\/tr>\n
9<\/td>\n1 Scope
2 Normative references
3 Terms and definitions <\/td>\n<\/tr>\n
11<\/td>\n4 Abbreviated terms
5 Experimental parameters
5.1 General
5.2 Parameters related to the electron probe
5.2.1 Accelerating voltage
5.2.2 Probe current
5.2.3 Magnification and field of view
5.3 Parameters related to wavelength dispersive X-ray spectrometers
5.3.1 General <\/td>\n<\/tr>\n
12<\/td>\n5.3.2 Take-off angle
5.3.3 Wavelength resolution
5.3.4 X-ray detector and Pulse height analyser
5.3.5 Peak location (wavelength) <\/td>\n<\/tr>\n
13<\/td>\n5.3.6 Background
5.4 Parameters related to the specimen
5.4.1 Specimen stage
5.4.2 Surface roughness
5.4.3 X-ray line
5.4.4 Analysis volume <\/td>\n<\/tr>\n
14<\/td>\n6 Procedures and measurements
6.1 General
6.2 Electron probe
6.2.1 Probe current
6.2.2 Probe diameter <\/td>\n<\/tr>\n
15<\/td>\n6.3 Parameters related to measured peaks
6.3.1 Dead time correction
6.3.2 Wavelength resolution of detected characteristic X-ray peaks <\/td>\n<\/tr>\n
16<\/td>\n6.3.3 Background subtraction <\/td>\n<\/tr>\n
17<\/td>\n6.4 Parameters related to the specimen
6.4.1 General
6.4.2 Analysis area
6.4.3 Analysis depth
6.4.4 Analysis volume
7 Test report <\/td>\n<\/tr>\n
19<\/td>\nAnnex A (informative) Methods of estimating analysis area <\/td>\n<\/tr>\n
21<\/td>\nAnnex B (informative) Methods of estimating analysis depth <\/td>\n<\/tr>\n
22<\/td>\nAnnex C (informative) Method of estimating X-ray analysis volume by applying the Monte Carlo (MC) simulation <\/td>\n<\/tr>\n
26<\/td>\nBibliography <\/td>\n<\/tr>\n<\/table>\n","protected":false},"excerpt":{"rendered":"

Microbeam analysis. Electron probe microanalysis. Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy<\/b><\/p>\n\n\n\n\n
Published By<\/td>\nPublication Date<\/td>\nNumber of Pages<\/td>\n<\/tr>\n
BSI<\/b><\/a><\/td>\n2024<\/td>\n28<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n","protected":false},"featured_media":462621,"template":"","meta":{"rank_math_lock_modified_date":false,"ep_exclude_from_search":false},"product_cat":[1001,2641],"product_tag":[],"class_list":{"0":"post-462611","1":"product","2":"type-product","3":"status-publish","4":"has-post-thumbnail","6":"product_cat-71-040-50","7":"product_cat-bsi","9":"first","10":"instock","11":"sold-individually","12":"shipping-taxable","13":"purchasable","14":"product-type-simple"},"_links":{"self":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product\/462611","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product"}],"about":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/types\/product"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media\/462621"}],"wp:attachment":[{"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/media?parent=462611"}],"wp:term":[{"taxonomy":"product_cat","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_cat?post=462611"},{"taxonomy":"product_tag","embeddable":true,"href":"https:\/\/pdfstandards.shop\/wp-json\/wp\/v2\/product_tag?post=462611"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}